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Modeling Bipolar Power Semiconductor Devices

Posted By: AvaxGenius
Modeling Bipolar Power Semiconductor Devices

Modeling Bipolar Power Semiconductor Devices by Tanya K. Gachovska
English | PDF | 2013 | 95 Pages | ISBN : 162705121X | 1.4 MB

This book presents physics-based models of bipolar power semiconductor devices and their implementation in MATLAB and Simulink. The devices are subdivided into different regions, and the operation in each region, along with the interactions at the interfaces which are analyzed using basic semiconductor physics equations that govern their behavior. The Fourier series solution is used to solve the ambipolar diffusion equation in the lightly doped drift region of the devices. In addition to the external electrical characteristics, internal physical and electrical information, such as the junction voltages and the carrier distribution in different regions of the device, can be obtained using the models.

Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices

Posted By: AvaxGenius
Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices

Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices by Tanya Kirilova Gachovska
English | PDF | 2013 | 85 Pages | ISBN : 1627051899 | 2.9 MB

This book presents physics-based electro-thermal models of bipolar power semiconductor devices including their packages, and describes their implementation in MATLAB and Simulink. It is a continuation of our first book Modeling of Bipolar Power Semiconductor Devices. The device electrical models are developed by subdividing the devices into different regions and the operations in each region, along with the interactions at the interfaces, are analyzed using the basic semiconductor physics equations that govern device behavior. The Fourier series solution is used to solve the ambipolar diffusion equation in the lightly doped drift region of the devices. In addition to the external electrical characteristics, internal physical and electrical information, such as junction voltages and carrier distribution in different regions of the device, can be obtained using the models.