Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years DATE by Rudy Lauwereins
English | PDF | 2008 | 498 Pages | ISBN : 140206487X | 3.7 MB
The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.