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Ellipsometry of Functional Organic Surfaces and Films [Repost]
![Ellipsometry of Functional Organic Surfaces and Films [Repost]](https://pixhost.icu/avaxhome/36/5c/002d5c36.jpeg)
Karsten Hinrichs, Klaus-Jochen Eichhorn - Ellipsometry of Functional Organic Surfaces and Films
Published: 2013-11-06 | ISBN: 3642401279 | PDF | 363 pages | 12 MB
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.