Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach (repost)
Y. Sun "Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach"
IET | English | 2007-01-01 | ISBN: 0863417450 | 416 pages | PDF | 5 MB
IET | English | 2007-01-01 | ISBN: 0863417450 | 416 pages | PDF | 5 MB
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.