Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications by Greg Haugstad
English | 2012 | ISBN: 0470638826 | 520 pages | PDF | 7 MB
English | 2012 | ISBN: 0470638826 | 520 pages | PDF | 7 MB
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations.
Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.